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Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.
A probe tip is an instrument used in scanning probe microscopes (SPMs) to scan the surface of a sample and make nano-scale images of surfaces and structures. The probe tip is mounted on the end of a cantilever and can be as sharp as a single atom .
Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.
This is a sub-diffraction technique. Examples of scanning probe microscopes are the atomic force microscope (AFM), the scanning tunneling microscope, the photonic force microscope and the recurrence tracking microscope. All such methods use the physical contact of a solid probe tip to scan the surface of an object, which is supposed to be ...
Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
Diagram illustrating near-field optics, with the diffraction of light coming from NSOM fiber probe, showing wavelength of light and the near-field. [1] Comparison of photoluminescence maps recorded from a molybdenum disulfide flake using NSOM with a campanile probe (top) and conventional confocal microscopy (bottom). Scale bars: 1 μm. [2]
Electrochemical AFM (EC-AFM) is a particular type of Scanning probe microscopy (SPM), which combines the classical Atomic force microscopy (AFM) together with electrochemical measurements. EC-AFM allows to perform in-situ AFM measurements in an electrochemical cell , in order to investigate the actual changes in the electrode surface morphology ...
Scanning gate microscopy (SGM) is a scanning probe microscopy technique with an electrically conductive tip used as a movable gate that couples capacitively to the sample and probes electrical transport on the nanometer scale.