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ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
Test automation tools can be expensive and are usually employed in combination with manual testing. Test automation can be made cost-effective in the long term, especially when used repeatedly in regression testing. A good candidate for test automation is a test case for common flow of an application, as it is required to be executed ...
One challenge for the industry is keeping up with the rapid advances in chip technology (I/O count/size/placement/spacing, I/O speed, internal circuit count/speed/power, thermal control, etc.) without being forced to continually upgrade the test equipment. Modern DFT techniques, hence, have to offer options that allow next generation chips and ...
Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.
FAN algorithm is an algorithm for automatic test pattern generation (ATPG). It was invented in 1983 by Hideo Fujiwara and Takeshi Shimono at the Department of Electronic Engineering, Osaka University, Japan. [1] It was the fastest ATPG algorithm at that time and was subsequently adopted by industry.
Test-driven development (TDD) is a way of writing code that involves writing an automated unit-level test case that fails, then writing just enough code to make the test pass, then refactoring both the test code and the production code, then repeating with another new test case.
Automatic test system switching test equipment allows for high-speed testing of a device or devices in a test situation, where strict sequences and combinations of switching must be observed. By automating the process in this way, the possibility of test errors and inaccuracies is minimized, and only systematic errors would generally be ...
A challenge with automation is that automated testing requires automated test oracles (an oracle is a mechanism or principle by which a problem in the software can be recognized). Such tools have value in load testing software (by signing on to an application with hundreds or thousands of instances simultaneously), or in checking for ...
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