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A test light, test lamp, voltage tester, or mains tester is a piece of electronic test equipment used to determine the presence of electricity in a piece of equipment under test. A test light is simpler and less costly than a measuring instrument such as a multimeter , and often suffices for checking for the presence of voltage on a conductor.
A General Electric NE-34 glow lamp, manufactured circa 1930. Neon was discovered in 1898 by William Ramsay and Morris Travers.The characteristic, brilliant red color that is emitted by gaseous neon when excited electrically was noted immediately; Travers later wrote, "the blaze of crimson light from the tube told its own story and was a sight to dwell upon and never forget."
4 Unsourced neon test light hazards. 1 comment. 5 Vintage test light. 1 comment. 6 Field detection - electric or magnetic? 5 comments. Toggle the table of contents.
The Test Procedures are developed from both the Test Design and the Test Case Specification. The document describes how the tester will physically run the test, the physical set-up required, and the procedure steps that need to be followed. The standard defines ten procedure steps that may be applied when running a test. [1]
Electronic test equipment is used to create signals and capture responses from electronic devices under test (DUTs). In this way, the proper operation of the DUT can be proven or faults in the device can be traced. Use of electronic test equipment is essential to any serious work on electronics systems.
IEC 61935 Specification for the testing of balanced and coaxial information technology cabling IEC 61936 Power installations exceeding 1 kV a.c. IEC 61937 Digital audio – Interface for non-linear PCM encoded audio bitstreams applying IEC 60958
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The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.