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An atomic force microscope on the left with controlling computer on the right. Atomic force microscopy [1] (AFM) gathers information by "feeling" or "touching" the surface with a mechanical probe. Piezoelectric elements that facilitate tiny but accurate and precise movements on (electronic) command enable precise scanning.
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Non-contact atomic force microscopy (nc-AFM), also known as dynamic force microscopy (DFM), is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms ) to the surface under study, the probe is then raster scanned across the surface, the image is then ...
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Atomic Force Microscopy: A precise mechanical probe is used to analyze surface irregularities X- Ray Diffraction: A crystalline structure causes x-rays to diverge, using the angle of these diffractions, measurements can be determined X-ray absorption Spectroscopy: Core electrons are excited using x-rays, and their transitions are measured
Scheme of the colloidal probe technique for direct force measurements in the sphere-plane and sphere-sphere geometries. The colloidal probe technique is commonly used to measure interaction forces acting between colloidal particles and/or planar surfaces in air or in solution. This technique relies on the use of an atomic force microscope (AFM).
Techniques that can be used to perform force spectroscopy include atomic force microscopy, [2] optical tweezers, [4] magnetic tweezers, acoustic force spectroscopy, [5] microneedles, [6] and biomembranes. [7] Force spectroscopy measures the behavior of a molecule under stretching or torsional mechanical force.
a Scanning tunneling microscopy (STM) overview of reaction product and unreacted species on Ag(111). V s = 30 mV, I t = 10 pA. b Constant-height STM data of diaza-HBC with partially superposed molecular model. V s = 5 mV. c Frequency-modulated atomic force microscopy (FM-AFM) and d Laplace-filtered FM-AFM data reveal details in the molecular ...