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  2. Ellipsometry - Wikipedia

    en.wikipedia.org/wiki/Ellipsometry

    The film and the substrate have different refractive indexes. In order to obtain data about film thickness, the light reflecting off of the substrate must be nulled. Nulling is achieved by adjusting the analyzer and polarizer so that all reflected light off of the substrate is extinguished.

  3. Refractive index and extinction coefficient of thin film ...

    en.wikipedia.org/wiki/Refractive_index_and...

    The challenge of characterizing thin films involves extracting t, n(λ) and k(λ) of the film from the measurement of R(λ) and/or T(λ). This can be achieved by combining the Forouhi–Bloomer dispersion equations for n ( λ ) and k ( λ ) with the Fresnel equations for the reflection and transmission of light at an interface [ 21 ] to obtain ...

  4. Interference filter - Wikipedia

    en.wikipedia.org/wiki/Interference_filter

    Dichroic filters use the principle of thin-film interference, and produce colors in the same way as oil films on water.When light strikes an oil film at an angle, some of the light is reflected from the top surface of the oil, and some is reflected from the bottom surface where it is in contact with the water.

  5. Thin-film thickness monitor - Wikipedia

    en.wikipedia.org/wiki/Thin-film_thickness_monitor

    Thin-film thickness monitors, deposition rate controllers, and so on, are a family of instruments used in high and ultra-high vacuum systems. They can measure the thickness of a thin film, not only after it has been made, but while it is still being deposited, and some can control either the final thickness of the film, the rate at which it is deposited, or both.

  6. Thin-film optics - Wikipedia

    en.wikipedia.org/wiki/Thin-film_optics

    Thin-film optics is the branch of optics that deals with very thin structured layers of different materials. [1] In order to exhibit thin-film optics, the thickness of the layers of material must be similar to the coherence length ; for visible light it is most often observed between 200 and 1000 nm of thickness.

  7. Thin film - Wikipedia

    en.wikipedia.org/wiki/Thin_film

    A thin film is a layer of materials ranging from fractions of a nanometer to several micrometers in thickness. [1] The controlled synthesis of materials as thin films (a process referred to as deposition) is a fundamental step in many applications.

  8. Four-terminal sensing - Wikipedia

    en.wikipedia.org/wiki/Four-terminal_sensing

    Four-point measurement of resistance between voltage sense connections 2 and 3. Current is supplied via force connections 1 and 4. In electrical engineering, four-terminal sensing (4T sensing), 4-wire sensing, or 4-point probes method is an electrical impedance measuring technique that uses separate pairs of current-carrying and voltage-sensing electrodes to make more accurate measurements ...

  9. Diffusive gradients in thin films - Wikipedia

    en.wikipedia.org/wiki/Diffusive_gradients_in...

    The diffusive gradients in thin films (DGT) technique is an environmental chemistry technique for the detection of elements and compounds in aqueous environments, including natural waters, [1] sediments [2] and soils. [3] It is well suited to in situ detection of bioavailable toxic trace metal contaminants.

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