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  2. FormFactor, Inc. - Wikipedia

    en.wikipedia.org/wiki/FormFactor,_Inc.

    The company completed an initial public offering (IPO) on the Nasdaq as FORM, [2] in June 2003 with 6 million shares priced at $14. [3] [4] FormFactor released the first x64 DRAM probe card in 2000, [5] followed by the x128 DRAM probe card in 2002. [6] [7] The company shipped the first SmartMatrix full-wafer probe cards in February 2009. [8]

  3. Probe card - Wikipedia

    en.wikipedia.org/wiki/Probe_card

    Use and manufacture. A probe card or DUT board is a printed circuit board (PCB), and is the interface between the integrated circuit and a test head, which in turn attaches to automatic test equipment (ATE) (or "tester"). [2] Typically, the probe card is mechanically docked to a Wafer testing prober and electrically connected to the ATE .

  4. FormFactor (FORM) Boosts Probe Card Efforts With New Facility

    www.aol.com/news/formfactor-form-boosts-probe...

    FormFactor (FORM) announces the opening of a new probe card manufacturing facility in Livermore, CA, in a bid to bolster its presence in the United States.

  5. Motherboard form factor - Wikipedia

    en.wikipedia.org/wiki/Motherboard_form_factor

    Motherboard form factor. In computing, the motherboard form factor is the specification of a motherboard – the dimensions, power supply type, location of mounting holes, number of ports on the back panel, etc. Specifically, in the IBM PC compatible industry, standard form factors ensure that parts are interchangeable across competing vendors ...

  6. Case report form - Wikipedia

    en.wikipedia.org/wiki/Case_report_form

    A case report form (or CRF) is a paper or electronic questionnaire specifically used in clinical trial research. [1] The case report form is the tool used by the sponsor of the clinical trial to collect data from each participating patient. All data on each patient participating in a clinical trial are held and/or documented in the CRF ...

  7. Non-contact wafer testing - Wikipedia

    en.wikipedia.org/wiki/Non-contact_wafer_testing

    If the antennae on the probe card and IC are properly aligned, then a transmitter on the probe card can send data wirelessly to the receiver on the IC via RF communication. This method has several advantages: no damage is done to circuits, pads, nor probe cards; no debris is created; probe pads are no longer required, on the periphery of the IC

  8. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment or automated test equipment (ATE) is any apparatus that performs tests on a device, known as the device under test (DUT), equipment under test (EUT) or unit under test (UUT), using automation to quickly perform measurements and evaluate the test results. An ATE can be a simple computer-controlled digital multimeter, or ...

  9. Spectrum analyzer - Wikipedia

    en.wikipedia.org/wiki/Spectrum_analyzer

    Spectrum analyzer. A spectrum analyzer measures the magnitude of an input signal versus frequency within the full frequency range of the instrument. The primary use is to measure the power of the spectrum of known and unknown signals. The input signal that most common spectrum analyzers measure is electrical; however, spectral compositions of ...