Search results
Results from the WOW.Com Content Network
Energy-dispersive X-ray spectroscopy (EDS, EDX, EDXS or XEDS), sometimes called energy dispersive X-ray analysis (EDXA or EDAX) or energy dispersive X-ray microanalysis (EDXMA), is an analytical technique used for the elemental analysis or chemical characterization of a sample. It relies on an interaction of some source of X-ray excitation and ...
In electron microscopy an electron beam excites X-rays; there are two main techniques for analysis of spectra of characteristic X-ray radiation: energy-dispersive X-ray spectroscopy (EDS) and wavelength dispersive X-ray spectroscopy (WDS). In X-ray transmission (XRT), the equivalent atomic composition (Z eff) is captured based on photoelectric ...
V.‐D. Hodoroaba & M. Procop. X-Ray Spectrometry, Vol 38, No 3, p 216-221, (2009). Improvements of the low-energy performance of a micro-focus x-ray source for XRF analysis with the SEM Procop, Mathias; et al. X‐Ray Spectrometry: An International Journal 38.4 (2009): 308-311. A microfocus X-ray source for improved EDS and XRF analysis in the ...
XANES – XANES, synonymous with NEXAFS (near edge X-ray absorption fine structure) XAS – X-ray absorption spectroscopy; X-CTR – X-ray crystal truncation rod scattering; X-ray crystallography; XDS – X-ray diffuse scattering; XES – X-ray emission spectroscopy; XPEEM – X-ray photoelectron emission microscopy; XPS – X-ray photoelectron ...
Lasers also made spectroscopy that used time methods more accurate by using speeds or decay times of photons at specific wavelengths and frequencies to keep time. [88] Laser spectroscopic techniques have been used for many different applications. One example is using laser spectroscopy to detect compounds in materials.
Energy-dispersive X-ray diffraction (EDXRD) is an analytical technique for characterizing materials. It differs from conventional X-ray diffraction by using polychromatic photons as the source and is usually operated at a fixed angle. [1] With no need for a goniometer, EDXRD is able to collect full diffraction patterns very quickly.
X-ray powder diffraction of Y 2 Cu 2 O 5 and Rietveld refinement with two phases, showing 1% of yttrium oxide impurity (red tickers) X-ray diffraction (XRD) Small-angle X-ray scattering (SAXS) Energy-dispersive X-ray spectroscopy (EDX, EDS) Wavelength dispersive X-ray spectroscopy (WDX, WDS) Electron energy loss spectroscopy (EELS)
Characteristic X-rays can be used to identify the particular element from which they are emitted. This property is used in various techniques, including X-ray fluorescence spectroscopy, particle-induced X-ray emission, energy-dispersive X-ray spectroscopy, and wavelength-dispersive X-ray spectroscopy.