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2. Electrostatic force microscope - Wikipedia

   en.wikipedia.org/wiki/Electrostatic_force_microscope

   Electrostatic force microscopy (EFM) is a type of dynamic non-contact atomic force microscopy where the electrostatic force is probed. ("Dynamic" here means that the cantilever is oscillating and does not make contact with the sample). This force arises due to the attraction or repulsion of separated charges.

3. Kelvin probe force microscope - Wikipedia

   en.wikipedia.org/wiki/Kelvin_probe_force_microscope

   A related technique, electrostatic force microscopy (EFM), directly measures the force produced on a charged tip by the electric field emanating from the surface. EFM operates much like magnetic force microscopy in that the frequency shift or amplitude change of the cantilever oscillation is used to detect the electric field. However, EFM is ...

4. Electrochemical AFM - Wikipedia

   en.wikipedia.org/wiki/Electrochemical_AFM

   Electrochemical AFM (EC-AFM) is a particular type of Scanning probe microscopy (SPM), which combines the classical Atomic force microscopy (AFM) together with electrochemical measurements. EC-AFM allows to perform in-situ AFM measurements in an electrochemical cell , in order to investigate the actual changes in the electrode surface morphology ...

5. Electrostatic force microscopy - Wikipedia

   en.wikipedia.org/?title=Electrostatic_force...

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6. Photoconductive atomic force microscopy - Wikipedia

   en.wikipedia.org/wiki/Photoconductive_Atomic...

   Electrostatic force microscopy (EFM) and scanning Kelvin probe microscopy (SKPM) have been utilized in the studies of electron injection and charge trapping effects, while scanning tunneling microscopy (STM) and conductive atomic force microscopy (c-AFM) have been used to investigate electron transport properties within these organic ...

7. Force spectroscopy - Wikipedia

   en.wikipedia.org/wiki/Force_spectroscopy

   The so-called force curve is the graph of force (or more precisely, of cantilever deflection) versus the piezoelectric position on the Z axis. An ideal Hookean spring, for example, would display a straight diagonal force curve. Typically, the force curves observed in the force spectroscopy experiments consist of a contact (diagonal) region ...