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  2. Traction force microscopy - Wikipedia

    en.wikipedia.org/wiki/Traction_force_microscopy

    For example, cellular migration velocities and plithotaxis are observed alongside a computed stress variation map of a monolayer sheet of cells, in an approach termed monolayer stress microscopy. [15] The mechanical behavior of single cells versus a confluent layer of cells differ in that the monolayer experiences a "tug-of-war" state.

  3. Colloidal probe technique - Wikipedia

    en.wikipedia.org/wiki/Colloidal_probe_technique

    Scheme of the colloidal probe technique for direct force measurements in the sphere-plane and sphere-sphere geometries. The colloidal probe technique is commonly used to measure interaction forces acting between colloidal particles and/or planar surfaces in air or in solution. This technique relies on the use of an atomic force microscope (AFM).

  4. Characterization of nanoparticles - Wikipedia

    en.wikipedia.org/wiki/Characterization_of_nano...

    While the two terms are often used interchangeably, according to ISO nanotechnology definitions, an agglomerate is a reversible collection of particles weakly bound, for example by van der Waals forces or physical entanglement, whereas an aggregate is composed of irreversibly bonded or fused particles, for example through covalent bonds.

  5. Electrochemical AFM - Wikipedia

    en.wikipedia.org/wiki/Electrochemical_AFM

    Electrochemical AFM (EC-AFM) is a particular type of Scanning probe microscopy (SPM), which combines the classical Atomic force microscopy (AFM) together with electrochemical measurements. EC-AFM allows to perform in-situ AFM measurements in an electrochemical cell , in order to investigate the actual changes in the electrode surface morphology ...

  6. Infrared Nanospectroscopy (AFM-IR) - Wikipedia

    en.wikipedia.org/wiki/Infrared_Nanospectroscopy...

    Specifically, the resonance frequency shifts to higher frequencies for stiffer materials and to lower frequencies for softer material. Additionally, the resonance becomes broader for materials with larger dissipation. These contact resonances have been studied extensively by the AFM community (see, for example, atomic force acoustic microscopy ...

  7. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    Kelvin probe force microscopy (KPFM), also known as surface potential microscopy, is a noncontact variant of atomic force microscopy (AFM). [ 1 ] [ 2 ] [ 3 ] By raster scanning in the x,y plane the work function of the sample can be locally mapped for correlation with sample features.

  8. Hegseth faces senators' concerns not only about his behavior ...

    www.aol.com/hegseth-faces-senators-concerns-not...

    The role of women in the military is another entry in the far-right's efforts to return the armed forces back to an earlier era, something Hegseth has embraced with Trump's approach to end “woke ...

  9. Piezoresponse force microscopy - Wikipedia

    en.wikipedia.org/wiki/Piezoresponse_force_microscopy

    Piezoresponse force microscopy is a technique which since its inception and first implementation by Güthner and Dransfeld [1] has steadily attracted more and more interest. This is due in large part to the many benefits and few drawbacks that PFM offers researchers in varying fields from ferroelectrics, semiconductors and even biology. [ 2 ]