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X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource
An example of K-alpha lines is Fe K-alpha emitted as iron atoms are spiraling into a black hole at the center of a galaxy. [8] The K-alpha line in copper is frequently used as the primary source of X-ray radiation in lab-based X-ray diffraction spectrometry (XRD) instruments.
X-ray diffraction (XRD) is still the most used method for structural analysis of chemical compounds. Yet, with increasing detail on the relation of K β {\displaystyle K_{\beta }} -line spectra and the surrounding chemical environment of the ionized metal atom, measurements of the so-called valence-to-core (V2C) energy region become ...
An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .
Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions.
Henry Moseley, a British physicist, was the first to discover a relation between the -lines and the atomic numbers of the probed elements. This was the birth hour of modern X-ray spectroscopy. Later, these lines could be used in elemental analysis to determine the contents of a sample.