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Automatic item generation (AIG), or automated item generation, is a process linking psychometrics with computer programming. It uses a computer algorithm to automatically create test items that are the basic building blocks of a psychological test. The method was first described by John R. Bormuth [1] in
ecu.test automates the control of the whole test environment and supports a broad range of test tools. Various abstraction layers for measured quantities allow its application on different testing levels, e.g. within the context of model in the loop, software in the loop and hardware in the loop as well as in real systems (vehicle and driver in the loop).
Lertap5 (Laboratory of Educational Research Test Analysis Program) is a comprehensive software package for test and survey analyses, developed for Windows and Macintosh computers with Microsoft Excel. Lertap5 includes: Test, item and option statistics; Classification consistency and mastery test analysis; Cheating detection procedures
Keyword-driven testing, also known as action word based testing (not to be confused with action driven testing), is a software testing methodology suitable for both manual and automated testing. This method separates the documentation of test cases – including both the data and functionality to use – from the prescription of the way the ...
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
Online testing means that a model-based testing tool connects directly to an SUT and tests it dynamically. Offline generation of executable tests means that a model-based testing tool generates test cases as computer-readable assets that can be later run automatically; for example, a collection of Python classes that embodies the generated ...
Tool support: The tool presented by Ostrand and Balcer only supported test case generation, but not the partitioning itself. Grochtmann and Wegener presented their tool, the Classification Tree Editor (CTE) which supports both partitioning as well as test case generation.
FAN algorithm is an algorithm for automatic test pattern generation (ATPG). It was invented in 1983 by Hideo Fujiwara and Takeshi Shimono at the Department of Electronic Engineering, Osaka University, Japan. [1] It was the fastest ATPG algorithm at that time and was subsequently adopted by industry.