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Automatic item generation (AIG), or automated item generation, is a process linking psychometrics with computer programming. It uses a computer algorithm to automatically create test items that are the basic building blocks of a psychological test. The method was first described by John R. Bormuth [1] in the 1960s but was not developed until ...
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
Automatic Test Markup Language (ATML) is a collection of XML schemas that allows automatic test systems (ATS) to exchange test information in a common format adhering to the XML standard. The purpose of ATML is to support test programs, test asset, and unit under test (UUT) interoperability within an automatic test environment.
FAN algorithm is an algorithm for automatic test pattern generation (ATPG). It was invented in 1983 by Hideo Fujiwara and Takeshi Shimono at the Department of Electronic Engineering, Osaka University, Japan. [1] It was the fastest ATPG algorithm at that time and was subsequently adopted by industry.
In most cases, test automation covers continuous changes to minimize manual regression testing. Changes are usually noted by monitoring test log diffs. For example, differences in the number of failures signal probable changes either in AUT or in test code (broken test code base, instabilities) or in both.
Test data can be generated by the tester or by a program or function that assists the tester. It can be recorded for reuse or used only once. Test data may be created manually, using data generation tools (often based on randomness), [4] or retrieved from an existing production environment. The data set may consist of synthetic (fake) data, but ...
The Cambridge Neuropsychological Test Automated Battery (CANTAB), [1] originally developed at the University of Cambridge in the 1980s but now provided in a commercial capacity by Cambridge Cognition, is a computer-based cognitive assessment system consisting of a battery of neuropsychological tests, administered to subjects using a touch screen computer.
SuperCROSS – comprehensive statistics package with ad-hoc, cross tabulation analysis; Systat – general statistics package; The Unscrambler – free-to-try commercial multivariate analysis software for Windows; Unistat – general statistics package that can also work as Excel add-in; WarpPLS – statistics package used in structural ...