Search results
Results from the WOW.Com Content Network
Automatic item generation (AIG), or automated item generation, is a process linking psychometrics with computer programming. It uses a computer algorithm to automatically create test items that are the basic building blocks of a psychological test. The method was first described by John R. Bormuth [1] in the 1960s but was not developed until ...
Keyword-driven testing, also known as action word based testing (not to be confused with action driven testing), is a software testing methodology suitable for both manual and automated testing. This method separates the documentation of test cases – including both the data and functionality to use – from the prescription of the way the ...
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
Model-based testing is an application of model-based design for designing and optionally also executing artifacts to perform software testing or system testing. Models can be used to represent the desired behavior of a system under test (SUT), or to represent testing strategies and a test environment.
FAN algorithm is an algorithm for automatic test pattern generation (ATPG). It was invented in 1983 by Hideo Fujiwara and Takeshi Shimono at the Department of Electronic Engineering, Osaka University, Japan. [1] It was the fastest ATPG algorithm at that time and was subsequently adopted by industry.
Commercial. Automated software quality solution that includes unit test generation and execution as well as reporting industry standard code coverage. TickSpec: Yes [410] Behavior-driven development framework for .NET and Silverlight. Supports the Gherkin language as used by Cucumber and extends it with combinatorial examples.
Tool support: The tool presented by Ostrand and Balcer only supported test case generation, but not the partitioning itself. Grochtmann and Wegener presented their tool, the Classification Tree Editor (CTE) which supports both partitioning as well as test case generation.
Increased complexity of ASICs leads to requirements of more complex test programs with longer development times. An automated test program generation could simplify and speed up this process. Teradyne Inc. together with Robert Bosch GmbH agreed to develop a concept and a tool chain for an automated test-program generation.