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X-ray diffraction. X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called ...
X-ray diffraction computed tomography, often abbreviated as XRD-CT, typically refers to the technique invented by Harding et al. [1] which assumes that the acquired data are powder diffraction data. For this reason, it has also been mentioned as powder diffraction computed tomography [7] and diffraction scattering computed tomography (DSCT), [8 ...
Three-dimensional X-ray diffraction (3DXRD) is a microscopy technique using hard X-rays (with energy in the 30-100 keV range) to investigate the internal structure of polycrystalline materials in three dimensions. [1][2] For a given sample, 3DXRD returns the shape, juxtaposition, and orientation of the crystallites ("grains") it is made of ...
The International Centre for Diffraction Data (ICDD) maintains a database of powder diffraction patterns, the Powder Diffraction File (PDF), including the d-spacings (related to angle of diffraction) and relative intensities of observable diffraction peaks. Patterns may be experimentally determined, or computed based on crystal structure and ...
Miniflex is an X-ray diffraction (XRD) analytical measuring instrument produced by Rigaku. The current instrument is the fourth in a series introduced in 1973. The Rigaku MiniFlex is historically significant in that it was the first commercial benchtop (tabletop) X-ray diffraction instrument. When introduced in 1973, the original Miniflex was ...
Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions. The height, width and position of these reflections can be used to determine many ...
Olex2 is a relatively mature open source software [8][9] with a BSD licence which provides tools for crystallographic structure solution, refinement, and final report preparation. It is still in the stage of active development. Olex2 provides numerous tools for structure analysis and publication, including Fourier maps, void calculation and ...
Powder diffraction. Electron powder pattern (red) of an Al film with an fcc spiral overlay (green) and a line of intersections (blue) that determines lattice parameter. [1] X-ray powder diffraction of Y 2 Cu 2 O 5 and Rietveld refinement with two phases, showing 1% of yttrium oxide impurity (red tickers). Powder diffraction is a scientific ...
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