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  2. X-ray diffraction computed tomography - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction_computed...

    X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [1] using a laboratory diffractometer and a monochromatic X-ray pencil beam.

  3. 7 Costco Computer Deals To Shop This Fall - AOL

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    The 14-inch model is on sale too, at $1,499.99 — $250 off. For You: 7 Aldi Fan Favorites That the Middle Class Needs To Buy This Fall MSI Aegis R2 Gaming Desktop

  4. X-ray fluorescence - Wikipedia

    en.wikipedia.org/wiki/X-ray_fluorescence

    X-ray diffraction (XRD) is still the most used method for structural analysis of chemical compounds. Yet, with increasing detail on the relation of K β {\displaystyle K_{\beta }} -line spectra and the surrounding chemical environment of the ionized metal atom, measurements of the so-called valence-to-core (V2C) energy region become ...

  5. X-ray photoelectron spectroscopy - Wikipedia

    en.wikipedia.org/wiki/X-ray_photoelectron...

    X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the very topmost 200 atoms, 0.01 um, 10 nm of any surface. It belongs to the family of photoemission spectroscopies in which electron population spectra are obtained by irradiating a material with a beam of X-rays .

  6. XRD - Wikipedia

    en.wikipedia.org/wiki/XRD

    XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource

  7. Malvern Panalytical - Wikipedia

    en.wikipedia.org/wiki/Malvern_Panalytical

    Malvern Panalytical is a Spectris plc company. [6] The company is a manufacturer and supplier of laboratory analytical instruments. [7] [8] It has been influential in the development of the Malvern Correlator, [9] and it remains notable for its work in the advancement of particle sizing technology. [10]

  8. X-ray emission spectroscopy - Wikipedia

    en.wikipedia.org/wiki/X-ray_emission_spectroscopy

    Although this is quite a lot of information, it must be combined with absorption measurements of the so-called "pre-edge" region. Those measurements are called XANES (X-ray absorption near edge structure). Fig. 4: XAS measurement versus HERFD. In synchrotron facilities, that measurement can be done at the same time.

  9. Powder diffraction - Wikipedia

    en.wikipedia.org/wiki/Powder_diffraction

    The result is that the crystallinity will never reach 100%. Powder XRD can be used to determine the crystallinity by comparing the integrated intensity of the background pattern to that of the sharp peaks. Values obtained from powder XRD are typically comparable but not quite identical to those obtained from other methods such as DSC.

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