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Subscripts 1 and 2 refer to initial and final optical media respectively. These ratios are sometimes also used, following simply from other definitions of refractive index, wave phase velocity, and the luminal speed equation:
[1] [2] It is a powerful tool to study properties of materials on the atomic scale, such as semiconductors, metals, nanoparticles and sp 2-bonded carbon (e.g., graphene, C nanotubes). While this term is often also used to refer to high resolution scanning transmission electron microscopy, mostly in high angle annular dark field mode, this ...
An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...
A simple microscope uses a lens or set of lenses to enlarge an object through angular magnification alone, giving the viewer an erect enlarged virtual image. [1] [2] The use of a single convex lens or groups of lenses are found in simple magnification devices such as the magnifying glass, loupes, and eyepieces for telescopes and microscopes.
Scanning electron microscope image of a thin TEM sample milled by FIB. The thin membrane shown here is suitable for TEM examination; however, at ~300-nm thickness, it would not be suitable for high-resolution TEM without further milling. More recently focused ion beam methods have been used to prepare samples. FIB is a relatively new technique ...
Reproduction of an early electron microscope constructed by Ernst Ruska in the 1930s. Many developments laid the groundwork of the electron optics used in microscopes. [2] One significant step was the work of Hertz in 1883 [3] who made a cathode-ray tube with electrostatic and magnetic deflection, demonstrating manipulation of the direction of an electron beam.
Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In the microscope an ...
Intermediate between fixed magnification and zoom magnification systems is a system attributed to Galileo as the "Galilean optical system"; here an arrangement of fixed-focus convex lenses is used to provide a fixed magnification, but with the crucial distinction that the same optical components in the same spacing will, if physically inverted ...
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