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2. X-ray crystallography - Wikipedia

   en.wikipedia.org/wiki/X-ray_crystallography

   An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.

3. X-ray diffraction - Wikipedia

   en.wikipedia.org/wiki/X-ray_diffraction

   X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern.

4. Measure (mathematics) - Wikipedia

   en.wikipedia.org/wiki/Measure_(mathematics)

   Such a measure is called a probability measure or distribution. See the list of probability distributions for instances. The Dirac measure δ a (cf. Dirac delta function) is given by δ a (S) = χ S (a), where χ S is the indicator function of . The measure of a set is 1 if it contains the point and 0 otherwise.

5. Glossary of mathematical symbols - Wikipedia

   en.wikipedia.org/wiki/Glossary_of_mathematical...

   A mathematical symbol is a figure or a combination of figures that is used to represent a mathematical object, an action on mathematical objects, a relation between mathematical objects, or for structuring the other symbols that occur in a formula.

6. XRD - Wikipedia

   en.wikipedia.org/wiki/XRD

   XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource

7. Structure factor - Wikipedia

   en.wikipedia.org/wiki/Structure_factor

   Consider the scattering of a beam of wavelength by an assembly of particles or atoms stationary at positions , =, …,.Assume that the scattering is weak, so that the amplitude of the incident beam is constant throughout the sample volume (Born approximation), and absorption, refraction and multiple scattering can be neglected (kinematic diffraction).

8. Scherrer equation - Wikipedia

   en.wikipedia.org/wiki/Scherrer_Equation

   The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.

9. Clay mineral X-ray diffraction - Wikipedia

   en.wikipedia.org/wiki/Clay_Mineral_X-Ray_Diffraction

   Typically, powder X-ray diffraction (XRD) is an average of randomly oriented microcrystals that should equally represent all crystal orientation if a large enough sample is present. X-rays are directed at the sample while slowly rotated that produce a diffraction pattern that shows intensity of x-rays collected at different angles. Randomly ...