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Automatic item generation (AIG), or automated item generation, is a process linking psychometrics with computer programming. It uses a computer algorithm to automatically create test items that are the basic building blocks of a psychological test. The method was first described by John R. Bormuth [1] in the 1960s but was not developed until ...
TAP (Test Analysis Program) is a free Windows program written in Delphi Pascal that performs test and item analyses based on classical test theory. TAP provides reports on examinee total scores, item statistics (e.g., item difficulty, item discrimination, point-biserial), options analyses, and other useful information.
Item tree analysis (ITA) is a data analytical method which allows constructing a hierarchical structure on the items of a questionnaire or test from observed response patterns. Assume that we have a questionnaire with m items and that subjects can answer positive (1) or negative (0) to each of these items, i.e. the items are dichotomous .
In practical test construction, item analysis is an iterative process, and cannot be entirely automated. The psychometrician's judgement is required to determine whether the emerging set of items to be retained constitutes a satisfactory test of the target construct. [citation needed] The three criteria above do not always agree, and a balance ...
A simple method for controlling item exposure is the "randomesque" or strata method. Rather than selecting the most informative item at each point in the test, the algorithm randomly selects the next item from the next five or ten most informative items. This can be used throughout the test, or only at the beginning. [3] Another method is the ...
The group of items is then answered by a large number of participants and analyzed using various statistical methods, such as exploratory factor analysis or principal component analysis. These methods allow researchers to analyze natural relationships among the questions and then label components of the scale based on how the questions group ...
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ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.