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Boron trioxide or diboron trioxide is the oxide of boron with the formula B 2 O 3.It is a colorless transparent solid, almost always glassy (amorphous), which can be crystallized only with great difficulty.
An Ellingham diagram is a graph showing the temperature dependence of the stability of compounds. This analysis is usually used to evaluate the ease of reduction of metal oxides and sulfides . These diagrams were first constructed by Harold Ellingham in 1944. [ 1 ]
Example Bjerrum plot: Change in carbonate system of seawater from ocean acidification.. A Bjerrum plot (named after Niels Bjerrum), sometimes also known as a Sillén diagram (after Lars Gunnar Sillén), or a Hägg diagram (after Gunnar Hägg) [1] is a graph of the concentrations of the different species of a polyprotic acid in a solution, as a function of pH, [2] when the solution is at ...
X-ray crystal truncation rod scattering is a powerful method in surface science, based on analysis of surface X-ray diffraction (SXRD) patterns from a crystalline surface. For an infinite crystal, the diffracted pattern is concentrated in Dirac delta function like Bragg peaks.
Surface X-ray diffraction (SXRD), which is similar to RHEED but uses X-rays, and is also used to interrogate surface structure. [3] X-ray standing waves, another X-ray variant where the intensity decay into a sample from diffraction is used to analyze chemistry. [4]
Small-angle X-ray scattering (SAXS) is a small-angle scattering technique by which nanoscale density differences in a sample can be quantified. This means that it can determine nanoparticle size distributions, resolve the size and shape of (monodisperse) macromolecules, determine pore sizes and characteristic distances of partially ordered materials. [1]
Examples of determining indices for a plane using intercepts with axes; left (111), right (221) There are two equivalent ways to define the meaning of the Miller indices: [1] via a point in the reciprocal lattice, or as the inverse intercepts along the lattice vectors.
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.