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  2. Electron microscope - Wikipedia

    en.wikipedia.org/wiki/Electron_microscope

    Reproduction of an early electron microscope constructed by Ernst Ruska in the 1930s. Many developments laid the groundwork of the electron optics used in microscopes. [2] One significant step was the work of Hertz in 1883 [3] who made a cathode-ray tube with electrostatic and magnetic deflection, demonstrating manipulation of the direction of an electron beam.

  3. Electron configurations of the elements (data page) - Wikipedia

    en.wikipedia.org/wiki/Electron_configurations_of...

    However there are numerous exceptions; for example the lightest exception is chromium, which would be predicted to have the configuration 1s 2 2s 2 2p 6 3s 2 3p 6 3d 4 4s 2, written as [Ar] 3d 4 4s 2, but whose actual configuration given in the table below is [Ar] 3d 5 4s 1.

  4. Microscopic scale - Wikipedia

    en.wikipedia.org/wiki/Microscopic_scale

    The shape and texture in each individual grain is made visible through the microscope. [7] As the microscopic scale covers any object that cannot be seen by the naked eye, yet is visible under a microscope, the range of objects that fall under this scale can be as small as an atom, visible underneath a transmission electron microscope. [8]

  5. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...

  6. Electron energy loss spectroscopy - Wikipedia

    en.wikipedia.org/wiki/Electron_energy_loss...

    Here mfp is the mean free path of electron inelastic scattering, which has been tabulated for most elemental solids and oxides. [ 14 ] The spatial resolution of this procedure is limited by the plasmon localization and is about 1 nm, [ 6 ] meaning that spatial thickness maps can be measured in scanning transmission electron microscopy with ~1 ...

  7. Photoemission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Photoemission_electron...

    The specimen is part of the electron-optical system. Low-energy electron microscopy and mirror electron microscopy (MEM): these two electron emission microscopy use electron gun supply beams which are directed toward the specimen, decelerated and backscattered from the specimen or reflected just before reaching the specimen. In photoemission ...

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