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X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
Early X-ray microscopes by Paul Kirkpatrick and Albert Baez used grazing-incidence reflective X-ray optics to focus the X-rays, which grazed X-rays off parabolic curved mirrors at a very high angle of incidence. An alternative method of focusing X-rays is to use a tiny Fresnel zone plate of concentric gold or nickel rings on a silicon dioxide ...
X-ray mirrors can be built, but only if the angle from the plane of reflection is very low (typically 10 arc-minutes to 2 degrees). [2] These are called glancing (or grazing ) incidence mirrors . In 1952, Hans Wolter outlined three ways a telescope could be built using only this kind of mirror.
The angle of incidence, in geometric optics, is the angle between a ray incident on a surface and the line perpendicular (at 90 degree angle) to the surface at the point of incidence, called the normal. The ray can be formed by any waves, such as optical, acoustic, microwave, and X-ray. In the figure below, the line representing a ray makes an ...
Reading positive responses in USA Today prompted Khan to incorporate Khan Academy in 2008 and quit his job the same year to focus full-time on creating educational tutorials (then released under the name Khan Academy) [11] Khan Lab School, a school founded by Sal Khan and associated with Khan Academy, opened on September 15, 2014, in Mountain ...
Total external reflection is a phenomenon traditionally involving X-rays, but in principle any type of electromagnetic or other wave, closely related to total internal reflection. Total internal reflection describes the fact that radiation (e.g. visible light) can, at certain angles, be totally reflected from an interface between two media of ...
Sources of soft X-rays suitable for microscopy, such as synchrotron radiation sources, have fairly low brightness of the required wavelengths, so an alternative method of image formation is scanning transmission soft X-ray microscopy. Here the X-rays are focused to a point and the sample is mechanically scanned through the produced focal spot.