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  2. Battery leakage - Wikipedia

    en.wikipedia.org/wiki/Battery_leakage

    In personal computers, Ni-Cd batteries first saw use in the mid-1980s as a cheaper alternative to lithium batteries for powering real-time clocks and preserving BIOS settings. Nickel–cadmium batteries were also briefly used in laptop battery packs, until the advent of commercially viable nickel–metal hydride batteries in the early 1990s. [9]

  3. Laptop - Wikipedia

    en.wikipedia.org/wiki/Laptop

    A laptop's battery is charged using an external power supply, which is plugged into a wall outlet. The power supply outputs a DC voltage typically in the range of 7.2—24 volts. The power supply is usually external and connected to the laptop through a DC connector cable. In most cases, it can charge the battery and power the laptop ...

  4. Water-activated battery - Wikipedia

    en.wikipedia.org/wiki/Water-activated_battery

    Side-view of water-activated radiosonde battery Radiosonde battery still in protective wrapper. Typically, a large variety of aqueous solutions can be used in place of plain water. This battery type is specifically designed to pollute less (see environmentally friendly claims) due to the lesser use or the absence of heavy metals.

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  6. AOL Mail

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    Get AOL Mail for FREE! Manage your email like never before with travel, photo & document views. Personalize your inbox with themes & tabs. You've Got Mail!

  7. Aqueous battery - Wikipedia

    en.wikipedia.org/wiki/Aqueous_battery

    An aqueous battery is an electric battery that uses a water-based solution as an electrolyte. The aqueous batteries are known since 1860s, do not have the energy density and cycle life required by the grid storage and electric vehicles , [ 1 ] but are considered safe, reliable and inexpensive in comparison with the lithium-ion ones. [ 2 ]

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  9. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    This failure is the most common and easiest to detect, and is affected by reduction of the active channel of the transistor in gate sinking and depletion of the donor density in the active channel for hydrogen poisoning. Degradation in gate leakage current. This occurs at accelerated life tests or high temperatures and is suspected to be caused ...