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X-ray detectors are devices used to measure the flux, spatial distribution, spectrum, and/or other properties of X-rays. Detectors can be divided into two major categories: imaging detectors (such as photographic plates and X-ray film (photographic film), now mostly replaced by various digitizing devices like image plates or flat panel ...
Indirect detectors contain a layer of scintillator material, typically either gadolinium oxysulfide or cesium iodide, which converts the x-rays into light.Directly behind the scintillator layer is an amorphous silicon detector array manufactured using a process very similar to that used to make LCD televisions and computer monitors.
Like other solid state X-ray detectors, silicon drift detectors measure the energy of an incoming photon by the amount of ionization it produces in the detector material. This varying ionization produces varying charge, which the detector electronics measure for each incoming photon. [ 1 ]
The X-ray detector layer is a semiconductor, typically cadmium telluride (CdTe) or cadmium zinc telluride (CdZnTe), between 1 – 3 mm thick. The detectors consist of a planar cathode and a pixelated anode and are operated under a negative bias voltage.
Diffraction pattern of the protein thaumatin in its tetragonal crystal form, recorded on a PILATUS 6M at the HZB MX beamline BL14.1.. PILATUS is the name of a series of x-ray detectors originally developed by the Paul Scherrer Institute at the Swiss Light Source and further developed and commercialized by DECTRIS.
As an example, each mm 2 of a CT detector may receive several hundred million photon interactions per second during a scan. [4] To avoid saturation in areas where little material is present between the X-ray source and the detector, the pulse resolving time must be small compared to the average time between photon interactions in a pixel.
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