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  2. Qualcomm EDL mode - Wikipedia

    en.wikipedia.org/wiki/Qualcomm_EDL_mode

    Generally, test points are a pair of contacts, which can be some way apart. EDL can be accessed by opening the back of the phone, finding the location of the test point, which depends on the model, and using a pair of metal tweezers to short the connectors and boot the phone into EDL. Further software tools are needed for actions in EDL mode.

  3. List of devices using Qualcomm Snapdragon systems on chips

    en.wikipedia.org/wiki/List_of_devices_using...

    Smartisan U3 Pro SE, Asus Zenfone 5 ZE620KL, Zenfone Max Pro (M1), BlackBerry Key2 LE, HTC U12 Life, Huawei Honor 8X Max (4 GB RAM), Infinix Zero 6, Zero 6 pro, Lenovo K5 Pro, Lenovo S5 Pro, Lenovo Z5, Meizu E3, Motorola Moto G7 Plus, Moto Z3 Play, One Power (P30 Note in China), P30, Moto X5, Nokia 6.1 Plus (X6 in China), 7.1, 6.2, Sony Xperia ...

  4. Key Code Qualifier - Wikipedia

    en.wikipedia.org/wiki/Key_Code_Qualifier

    Key Code Qualifier is an error-code returned by a SCSI device. When a SCSI target device returns a check condition in response to a command , the initiator usually then issues a SCSI Request Sense command .

  5. Trusted Platform Module - Wikipedia

    en.wikipedia.org/wiki/Trusted_Platform_Module

    A Trusted Platform Module (TPM) is a secure cryptoprocessor that implements the ISO/IEC 11889 standard. Common uses are verifying that the boot process starts from a trusted combination of hardware and software and storing disk encryption keys. A TPM 2.0 implementation is part of the Windows 11 system requirements. [1]

  6. Power-on self-test - Wikipedia

    en.wikipedia.org/wiki/Power-on_self-test

    The original IBM PC could be equipped with as little as 16 KB of RAM and typically had between 64 and 640 KB; depending on the amount of equipped memory, the computer's 4.77 MHz 8088 required between 5 seconds and 1.5 minutes to complete the POST and there was no way to skip it.

  7. Error code - Wikipedia

    en.wikipedia.org/wiki/Error_code

    Main page; Contents; Current events; Random article; About Wikipedia; Contact us; Pages for logged out editors learn more

  8. Test point - Wikipedia

    en.wikipedia.org/wiki/Test_point

    The two rows of holes (labelled #3) are test points used during the manufacture of this USB memory key. Testpoints on a printed circuit board (labelled E34, E35, E36, …) next to teardrop vias. A test point is a location within an electronic circuit that is used to monitor the state of the circuitry or inject test signals. [1]

  9. Low Pin Count - Wikipedia

    en.wikipedia.org/wiki/Low_Pin_Count

    Low Pin Count interface Winbond chip Trusted Platform Module installed on a motherboard, and using the LPC bus. The Low Pin Count (LPC) bus is a computer bus used on IBM-compatible personal computers to connect low-bandwidth devices to the CPU, such as the BIOS ROM (BIOS ROM was moved to the Serial Peripheral Interface (SPI) bus in 2006 [1]), "legacy" I/O devices (integrated into Super I/O ...