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  2. X-ray crystal truncation rod - Wikipedia

    en.wikipedia.org/wiki/X-ray_crystal_truncation_rod

    X-ray crystal truncation rod scattering is a powerful method in surface science, based on analysis of surface X-ray diffraction (SXRD) patterns from a crystalline surface. For an infinite crystal , the diffracted pattern is concentrated in Dirac delta function like Bragg peaks .

  3. Single-wavelength anomalous diffraction - Wikipedia

    en.wikipedia.org/wiki/Single-wavelength...

    Single-wavelength anomalous diffraction (SAD) is a technique used in X-ray crystallography that facilitates the determination of the structure of proteins or other biological macromolecules by allowing the solution of the phase problem.

  4. Clay mineral X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/Clay_Mineral_X-Ray_Diffraction

    D positions are calculated using Bragg’s law but because clay mineral analysis is one dimensional, l can substitute n, making the equation l λ = 2d sin Θ. When measuring the x-ray diffraction of clays, d is constant and λ is the known wavelength from the x-ray source, so the distance from one 00l peak to another is equal. [3]

  5. International Centre for Diffraction Data - Wikipedia

    en.wikipedia.org/wiki/International_Centre_for...

    It also publishes the journals Advances in X-ray Analysis and Powder Diffraction. In 2019, Materials Data, also known as MDI, merged with ICDD. Materials Data creates JADE software used to collect, analyze, and simulate XRD data and solve issues in an array of materials science projects.

  6. X-ray diffraction - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction

    X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.

  7. Scherrer equation - Wikipedia

    en.wikipedia.org/wiki/Scherrer_Equation

    The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis. It is named after Paul Scherrer.

  8. X-ray diffraction computed tomography - Wikipedia

    en.wikipedia.org/wiki/X-ray_diffraction_computed...

    X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .

  9. Illite crystallinity - Wikipedia

    en.wikipedia.org/wiki/Illite_crystallinity

    The sample is first broken down, using the steps above, and prepared for XRD analysis. Results from the XRD are then compared to pre-established values assigned to metamorphic zones/metamorphic facies. The targets of the results are the peaks on the XRD plots. Width of the illite XRD peak at one half of its height is collected and recorded with ...