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Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope , an instrument for imaging surfaces at the atomic level.
Image of reconstruction on a clean surface of gold. A scanning tunneling microscope (STM) is a type of scanning probe microscope used for imaging surfaces at the atomic level. . Its development in 1981 earned its inventors, Gerd Binnig and Heinrich Rohrer, then at IBM Zürich, the Nobel Prize in Physics in 1
NanoWorld is the global market leader for tips for scanning probe microscopy (SPM) and atomic force microscopy (AFM). The atomic force microscope (AFM) is the defining instrument for the whole field of nanoscience and nanotechnology. It enables its users in research and high-tech industry to investigate materials at the atomic scale.
This category contains articles about the different types of scanning probe microscopes and methods associated with them. Pages in category "Scanning probe microscopy" The following 49 pages are in this category, out of 49 total.
Dip pen nanolithography (DPN) is a scanning probe lithography technique where an atomic force microscope (AFM) tip is used to directly create patterns on a substrate. [1] It can be done on a range of substances with a variety of inks. A common example of this technique is exemplified by the use of alkane thiolates to imprint onto a gold surface ...
The Nano/Bio Interface Center is a Nanoscale Science and Engineering Center at the University of Pennsylvania.It specializes in bionanotechnology, combining aspects of life sciences and engineering, [1] with a particular focus in biomolecular optoelectronics and molecular motions, including developing new scanning probe microscopy techniques.
[14] [15] [2] The Scanning Tunneling Microscope is used mostly for morphological topological investigation of a clean conductive sample, because it is able to give an image of its surface with atomic resolution. The Atomic Force Microscope is a powerful tool in order to study tribology at a fundamental level.
As in optical microscopy, the contrast mechanism can be easily adapted to study different properties, such as refractive index, chemical structure and local stress. Dynamic properties can also be studied at a sub-wavelength scale using this technique. NSOM/SNOM is a form of scanning probe microscopy.
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