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  2. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    These can be classified in various ways, such as by time or cause. Failures can be caused by excess temperature, excess current or voltage, ionizing radiation, mechanical shock, stress or impact, and many other causes. In semiconductor devices, problems in the device package may cause failures due to contamination, mechanical stress of the ...

  3. Transistor aging - Wikipedia

    en.wikipedia.org/wiki/Transistor_aging

    Random telegraph noise (RTN) can also result, where the drain current fluctuates between several discrete levels, and is worsened with increasing temperature. Bias temperature instability (BTI) is where charge leaks into the oxide when voltage is applied to the gate, even with no current flowing through the transistor. When the voltage is ...

  4. Semiconductor - Wikipedia

    en.wikipedia.org/wiki/Semiconductor

    In certain semiconductors, excited electrons can relax by emitting light instead of producing heat. [10] Controlling the semiconductor composition and electrical current allows for the manipulation of the emitted light's properties. [11] These semiconductors are used in the construction of light-emitting diodes and fluorescent quantum dots.

  5. Semiconductor device - Wikipedia

    en.wikipedia.org/wiki/Semiconductor_device

    A semiconductor device is an electronic component that relies on the electronic properties of a semiconductor material (primarily silicon, germanium, and gallium arsenide, as well as organic semiconductors) for its function. Its conductivity lies between conductors and insulators.

  6. Electromigration - Wikipedia

    en.wikipedia.org/wiki/Electromigration

    Electromigration can be a cause of degradation in some power semiconductor devices such as low voltage power MOSFETs, in which the lateral current through the source contact metallisation (often aluminium) can reach the critical current densities during overload conditions. The degradation of the aluminium layer causes an increase in on-state ...

  7. Hot-carrier injection - Wikipedia

    en.wikipedia.org/wiki/Hot-carrier_injection

    Hot electrons can tunnel out of the semiconductor material, instead of recombining with a hole or being conducted through the material to a collector. Consequent effects include increased leakage current and possible damage to the encasing dielectric material if the hot carrier disrupts the atomic structure of the dielectric.

  8. Short-channel effect - Wikipedia

    en.wikipedia.org/wiki/Short-channel_effect

    This electronics-related article is a stub. You can help Wikipedia by expanding it.

  9. Carrier generation and recombination - Wikipedia

    en.wikipedia.org/wiki/Carrier_generation_and...

    Absorption is the active process in photodiodes, solar cells and other semiconductor photodetectors, while stimulated emission is the principle of operation in laser diodes. Besides light excitation, carriers in semiconductors can also be generated by an external electric field, for example in light-emitting diodes and transistors.