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This equation, Bragg's law, describes the condition on θ for constructive interference. [12] A map of the intensities of the scattered waves as a function of their angle is called a diffraction pattern. Strong intensities known as Bragg peaks are obtained in the diffraction pattern when the scattering angles satisfy Bragg condition.
In X-ray crystallography, wide-angle X-ray scattering (WAXS) or wide-angle X-ray diffraction (WAXD) is the analysis of Bragg peaks scattered to wide angles, which (by Bragg's law) are caused by sub-nanometer-sized structures. [1] It is an X-ray-diffraction [2] method and commonly used to determine a range of information about crystalline materials.
While the Bragg formulation assumes a unique choice of direct lattice planes and specular reflection of the incident X-rays, the Von Laue formula only assumes monochromatic light and that each scattering center acts as a source of secondary wavelets as described by the Huygens principle. Each scattered wave contributes to a new plane wave given by:
Scattering also includes the interaction of billiard balls on a table, the Rutherford scattering (or angle change) of alpha particles by gold nuclei, the Bragg scattering (or diffraction) of electrons and X-rays by a cluster of atoms, and the inelastic scattering of a fission fragment as it traverses a thin foil.
The dynamical theory of diffraction considers the wave field in the periodic potential of the crystal and takes into account all multiple scattering effects. Unlike the kinematic theory of diffraction which describes the approximate position of Bragg or Laue diffraction peaks in reciprocal space , dynamical theory corrects for refraction, shape ...
Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions.
Bragg diffraction from crystals, used in inelastic scattering experiments (neutron backscattering, X-ray backscattering spectroscopy); Compton scattering , used in Backscatter X-ray imaging. Stimulated backscatter , observed in non-linear optics , and described by a class of solutions to the three-wave equation .
where G, R g, and B are constants related to the scattering contrast, structural volume, surface area, and radius of gyration. q is the magnitude of the scattering vector which is related to the Bragg spacing, d, q = 2π/d = 4π/λ sin(θ/2). λ is the wavelength and θ is the scattering angle (2θ in diffraction).