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X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern.
X-ray crystallography is the experimental science of determining the atomic and molecular structure of a crystal, in which the crystalline structure causes a beam of incident X-rays to diffract in specific directions. By measuring the angles and intensities of the X-ray diffraction, a crystallographer can produce a three-dimensional picture of ...
Laue equations. In crystallography and solid state physics, the Laue equations relate incoming waves to outgoing waves in the process of elastic scattering, where the photon energy or light temporal frequency does not change upon scattering by a crystal lattice. They are named after physicist Max von Laue (1879–1960).
The dynamical theory of diffraction describes the interaction of waves with a regular lattice. The wave fields traditionally described are X-rays, neutrons or electrons and the regular lattice are atomic crystal structures or nanometer -scale multi-layers or self-arranged systems. In a wider sense, similar treatment is related to the ...
Diffraction topography (short: "topography") is a imaging technique based on Bragg diffraction. Diffraction topographic images ("topographies") record the intensity profile of a beam of X-rays (or, sometimes, neutrons) diffracted by a crystal. A topography thus represents a two-dimensional spatial intensity mapping (image) of the X-rays ...
Bragg's law. Physical law regarding scattering angles of radiation through a medium. In many areas of science, Bragg's law, Wulff –Bragg's condition, or Laue–Bragg interference are a special case of Laue diffraction, giving the angles for coherent scattering of waves from a large crystal lattice. It describes how the superposition of wave ...
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...
Laue seemed distracted and wanted to know what would be the effect if much smaller wavelengths were considered. In June, Sommerfeld reported to the Physikalische Gesellschaft of Göttingen on the successful diffraction of X-rays by Laue, Paul Knipping and Walter Friedrich at LMU, for which Laue would be awarded the Nobel Prize in Physics, in ...