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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
The angle of incidence, in geometric optics, is the angle between a ray incident on a surface and the line perpendicular (at 90 degree angle) to the surface at the point of incidence, called the normal. The ray can be formed by any waves, such as optical, acoustic, microwave, and X-ray. In the figure below, the line representing a ray makes an ...
It is valid whenever the radiation field is isotropic over distances comparable to or less than a radiation mean free path, such as in local thermal equilibrium. In practice, the mean opacity for Thomson electron scattering is: κ e s = 0.20 ( 1 + X ) c m 2 g − 1 {\displaystyle \kappa _{\rm {es}}=0.20(1+X)\,\mathrm {cm^{2}\,g^{-1}} } where X ...
X-ray reflectometry: is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers. Propagation of electric pulses and reflection at discontinuities in cables is used in time domain reflectometry (TDR) to detect and localize defects in electric wiring.
X-ray reflectivity is an analytical technique for determining thickness, roughness, and density of single layer and multilayer thin films. Wide-angle X-ray scattering (WAXS), a technique concentrating on scattering angles 2θ larger than 5°. Spectrum of various inelastic scattering processes that can be probed with inelastic X-ray scattering ...
Diagram of Lambertian diffuse reflection. The black arrow shows incident radiance, and the red arrows show the reflected radiant intensity in each direction. When viewed from various angles, the reflected radiant intensity and the apparent area of the surface both vary with the cosine of the viewing angle, so the reflected radiance (intensity per unit area) is the same from all viewing angles.
A Bernal chart (bər′nal ′chärt) in crystallography, is a chart used for indexing X-ray diffraction photographs from single crystals. From such a chart may be read the axial and radial cylindrical coordinates of that point in reciprocal space which corresponds to any particular X-ray reflection. [1]
X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
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