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  2. Scanning tunneling microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_tunneling_microscope

    The main components of a scanning tunneling microscope are the scanning tip, piezoelectrically controlled height (z axis) and lateral (x and y axes) scanner, and coarse sample-to-tip approach mechanism. The microscope is controlled by dedicated electronics and a computer. The system is supported on a vibration isolation system. [5]

  3. Traveling microscope - Wikipedia

    en.wikipedia.org/wiki/Traveling_microscope

    A travelling microscope is an instrument for measuring length with a resolution typically in the order of 0.01mm. The precision is such that better-quality instruments have measuring scales made from Invar to avoid misreadings due to thermal effects. The instrument comprises a microscope mounted

  4. Microscopic scale - Wikipedia

    en.wikipedia.org/wiki/Microscopic_scale

    The shape and texture in each individual grain is made visible through the microscope. [7] As the microscopic scale covers any object that cannot be seen by the naked eye, yet is visible under a microscope, the range of objects that fall under this scale can be as small as an atom, visible underneath a transmission electron microscope. [8]

  5. Scanning probe microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_probe_microscopy

    The resolution of the microscopes is not limited by diffraction, only by the size of the probe-sample interaction volume (i.e., point spread function), which can be as small as a few picometres. Hence the ability to measure small local differences in object height (like that of 135 picometre steps on <100> silicon) is unparalleled.

  6. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...

  7. List of measuring instruments - Wikipedia

    en.wikipedia.org/wiki/List_of_measuring_instruments

    A pair of scales: An instrument for measuring mass in a force field by balancing forces. Balance; Check weigher measures precise weight of items in a conveyor line, rejecting underweight or overweight objects. Inertial balance; Katharometer; Mass spectrometers measure the mass-to-charge ratio, not the mass, of ionised particles. Weighing scale

  8. Microscopy - Wikipedia

    en.wikipedia.org/wiki/Microscopy

    Antonie van Leeuwenhoek (1632–1723). The field of microscopy (optical microscopy) dates back to at least the 17th-century.Earlier microscopes, single lens magnifying glasses with limited magnification, date at least as far back as the wide spread use of lenses in eyeglasses in the 13th century [2] but more advanced compound microscopes first appeared in Europe around 1620 [3] [4] The ...

  9. Stereo microscope - Wikipedia

    en.wikipedia.org/wiki/Stereo_microscope

    The stereo, stereoscopic or dissecting microscope is an optical microscope variant designed for low magnification observation of a sample, typically using light reflected from the surface of an object rather than transmitted through it. The instrument uses two separate optical paths with two objectives and eyepieces to provide slightly ...