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The Rigaku MiniFlex is historically significant in that it was the first commercial benchtop (tabletop) X-ray diffraction instrument. When introduced in 1973, the original Miniflex was about one-tenth the size, and dramatically less expensive, than conventional X-ray diffraction equipment of the period.
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .
The detector end of a simple x-ray diffractometer with an area detector. The direction of the X-rays is indicated with the red arrow. A typical diffractometer consists of a source of radiation, a monochromator to choose the wavelength, slits to adjust the shape of the beam, a sample and a detector.
A Philips PW1606 X-ray fluorescence spectrometer with automated sample feed in a cement plant quality control laboratory XRF scanning of the Rembrandt-painting Syndics of the Drapers' Guild. A Helmut Fischer(company) X-ray fluorescence spectrometer which are used to check for metals coating thickness and any of potential contamination of ...
Rigaku manufactures and supplies scientific instrumentation to academia, industry and trade. These include X-ray diffractometers, single crystal diffractometers, X-ray Imagers, X-ray fluorescence spectrometers (both Energy Dispersive and Wavelength Dispersive varieties), thermal analysis equipment, Handheld Raman and LIBS analyzers and X-ray and EUV optics, X-ray sources and X-ray detectors.
It is an X-ray-diffraction [2] method and commonly used to determine a range of information about crystalline materials. The term WAXS is commonly used in polymer sciences to differentiate it from SAXS but many scientists doing "WAXS" would describe the measurements as Bragg/X-ray/powder diffraction or crystallography .
XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource