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JTAG (named after the Joint Test Action Group which codified it) is an industry standard for verifying designs of and testing printed circuit boards after manufacture.. JTAG implements standards for on-chip instrumentation in electronic design automation (EDA) as a complementary tool to digital simulation. [1]
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Each digital signal (pin or ball) on the package is defined, as are the registers and opcodes used in an IEEE 1149.1, IEEE 1149.6, IEEE 1149.8.1, IEEE 1532 and IEEE 1149.4 compliant IC. There is one instruction register, a minimum of a 1-bit bypass register, one boundary scan register and optionally a 32 bit device_id register.
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A later standard in the boundary-scan family, the IEEE 1149.6 Boundary-Scan Standard for Advanced Digital Networks, [4] utilizes the 1149.1 boundary-scan embedded instrumentation infrastructure but expands the types of chip-to-chip interconnects that can be tested. Whereas the 1149.1 standard defines a methodology for testing DC-coupled ...
To provide the boundary scan capability, IC vendors add additional logic to each of their devices, including scan cells for each of the external traces. These cells are then connected together to form the external boundary scan shift register (BSR), and combined with JTAG Test Access Port (TAP) controller support comprising four (or sometimes more) additional pins plus control circuitry.
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