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Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen. SPM was founded in 1981, with the invention of the scanning tunneling microscope, an instrument for imaging surfaces at the atomic level.
Scanning probe microscopy (SPM), a key invention in nanoscience, has by now been extended to a wide spectrum of basic and applied fields.
Scanning probe microscopy (SPM) is a method of sample surface observation that uses a physical probe to interrogate a specimen rather than light. This provides a wealth of information that cannot be obtained via light microscopy.
Scanning Probe Microscopy provides researchers with a larger variety of specimen observation environments using the same microscope and specimen reducing the time required to prepare and study specimens.
Scanning probe microscopy such as STM and atomic-force microscopy (AFM) are well known for their capability to visualize surfaces of materials with the highest spatial resolution. In terms of structural characterizations, AFM can attain a lateral resolution of 0.1 Å and vertical resolution of 0.05 Å [10] .
This work is a text-book for senior students, dedicated to one of the most modern technique in the field of surface science: the Scanning Probe Microscopy (SPM).
This PrimeView highlights the use of scanning probe microscopy across a range of applications, from chemistry and materials science to studying living systems.
This book explains the operating principles of atomic force microscopy and scanning tunneling microscopy. The aim of this book is to enable the reader to operate a scanning probe microscope successfully and understand the data obtained with the microscope.
The pure imaging capabilities of variations of probe-based microscope techniques, referred to as scanning probe microscopy (GlossaryTerm SPM ), have dominated the application of these methods at their early development stages.
The operating principles, capabilities, and resolution of scanning electron microscopy (SEM) and atomic force microscopy (AFM), as well as the needs for sample preparation and the constraints imposed on the sample environment within the microscope, are compared and contrasted.