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Fault detection, isolation, and recovery (FDIR) is a subfield of control engineering which concerns itself with monitoring a system, identifying when a fault has occurred, and pinpointing the type of fault and its location. Two approaches can be distinguished: A direct pattern recognition of sensor readings that indicate a fault and an analysis ...
A parity bit is a bit that is added to a group of source bits to ensure that the number of set bits (i.e., bits with value 1) in the outcome is even or odd. It is a very simple scheme that can be used to detect single or any other odd number (i.e., three, five, etc.) of errors in the output.
Here, each group of the same letter represents a 4-bit one-bit error-correcting codeword. The codeword cccc is altered in one bit and can be corrected, but the codeword dddd is altered in three bits, so either it cannot be decoded at all or it might be decoded incorrectly .
Since the leftmost divisor bit zeroed every input bit it touched, when this process ends the only bits in the input row that can be nonzero are the n bits at the right-hand end of the row. These n bits are the remainder of the division step, and will also be the value of the CRC function (unless the chosen CRC specification calls for some ...
When the data word is divided into 32-bit blocks, two 32-bit sums result and are combined into a 64-bit Fletcher checksum. Usually, the second sum will be multiplied by 2 32 and added to the simple checksum, effectively stacking the sums side-by-side in a 64-bit word with the simple checksum at the least significant end. This algorithm is then ...
The construction of a failure detector is an essential, but a very difficult problem that occurred in the development of the fault-tolerant component in a distributed computer system. As a result, the failure detector was invented because of the need for detecting errors in the massive information transaction in distributed computing systems.
A hardware interrupt is a condition related to the state of the hardware that may be signaled by an external hardware device, e.g., an interrupt request (IRQ) line on a PC, or detected by devices embedded in processor logic (e.g., the CPU timer in IBM System/370), to communicate that the device needs attention from the operating system (OS) [7] or, if there is no OS, from the bare metal ...
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.