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A. R. Forouhi and I. Bloomer deduced dispersion equations for the refractive index, n, and extinction coefficient, k, which were published in 1986 [1] and 1988. [2] The 1986 publication relates to amorphous materials, while the 1988 publication relates to crystalline.
Amorphous silicon (a-Si) is the non-crystalline form of silicon used for solar cells and thin-film transistors in LCDs.. Used as semiconductor material for a-Si solar cells, or thin-film silicon solar cells, it is deposited in thin films onto a variety of flexible substrates, such as glass, metal and plastic.
These parameters approximate amorphous silicon. [1] The Forouhi–Bloomer model is a mathematical formula for the frequency dependence of the complex-valued refractive index. The model can be used to fit the refractive index of amorphous and crystalline semiconductor and dielectric materials at energies near and greater than their optical band gap.
Since the refractive index is a fundamental physical property of a substance, it is often used to identify a particular substance, confirm its purity, or measure its concentration. The refractive index is used to measure solids, liquids, and gases. Most commonly it is used to measure the concentration of a solute in an aqueous solution.
Refraction at interface. Many materials have a well-characterized refractive index, but these indices often depend strongly upon the frequency of light, causing optical dispersion. Standard refractive index measurements are taken at the "yellow doublet" sodium D line, with a wavelength (λ) of 589 nanometers.
The behaviour of light-sensitive defect passivation in amorphous silicon networks has been a topic of study since the discovery of the Staebler–Wronski effect in 1977. [120] Staebler and Wronski found a gradual decrease in photoconductivity and dark conductivity of amorphous silicon thin films upon exposure to light for several hours. This ...
Silicon is transparent to infrared light with wavelengths above about 1.1 micrometres. [58] Silicon also has a very high refractive index, of about 3.5. [58] The tight optical confinement provided by this high index allows for microscopic optical waveguides, which may have cross-sectional dimensions of only a few hundred nanometers. [10]
A total internal reflection fluorescence microscope (TIRFM) is a type of microscope with which a thin region of a specimen, usually less than 200 nanometers can be observed. TIRFM is an imaging modality which uses the excitation of fluorescent cells in a thin optical specimen section that is supported on a glass slide.