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X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers.
X-ray optics is the branch of optics dealing with X-rays, rather than visible light.It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and X-ray astronomy.
Since X-rays penetrate most objects, there is no need to specially prepare them for X-ray microscopy observations. Unlike visible light, X-rays do not reflect or refract easily and are invisible to the human eye. Therefore, an X-ray microscope exposes film or uses a charge-coupled device (CCD) detector to detect X-rays that pass through the ...
Each dot, called a reflection, forms from the coherent interference of scattered X-rays passing through the crystal. X-ray scattering techniques are a family of non-destructive analytical techniques which reveal information about the crystal structure , chemical composition, and physical properties of materials and thin films.
Also similar is reflection high-energy electron diffraction which typically leads to rings of diffraction spots. [18] With X-rays the effect of having small crystals is described by the Scherrer equation. [13] [19] [20] This leads to broadening of the Bragg peaks which can be used to estimate the size of the crystals.
Focusing X-rays with glancing reflection. When dealing with a beam that is nearly parallel to a surface, it is sometimes more useful to refer to the angle between the beam and the surface tangent, rather than that between the beam and the surface normal. The 90-degree complement to the angle of incidence is called the grazing angle or glancing ...
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern.
Anomalous X-ray scattering (MAD or SAD phasing) – the X-ray wavelength may be scanned past an absorption edge [a] of an atom, which changes the scattering in a known way. By recording full sets of reflections at three different wavelengths (far below, far above and in the middle of the absorption edge) one can solve for the substructure of ...