Search results
Results from the WOW.Com Content Network
"A Review of High-Energy X-Ray Diffraction from Glasses and Liquids". ISRN Materials Science. 2012: 1– 19. doi: 10.5402/2012/852905. Eberhard Haug; Werner Nakel (2004). The elementary process of Bremsstrahlung. World Scientific Lecture Notes in Physics. Vol. 73. River Edge, NJ: World Scientific. ISBN 978-981-238-578-9.
An X-ray diffraction pattern of a crystallized enzyme. The pattern of spots (reflections) and the relative strength of each spot (intensities) can be used to determine the structure of the enzyme. The relative intensities of the reflections provides information to determine the arrangement of molecules within the crystal in atomic detail.
The Scherrer equation, in X-ray diffraction and crystallography, is a formula that relates the size of sub-micrometre crystallites in a solid to the broadening of a peak in a diffraction pattern. It is often referred to, incorrectly, as a formula for particle size measurement or analysis.
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
Cite4Wiki, an XUL-based add-on for Pale Moon to generate {} and {} for the browser's current page. citemark – A bookmarklet to help create {} templates; see the developer's page for details; RefScript: A bookmarklet that generates references with a single click. Works with a few news websites (BBC, Daily Mirror, Daily Telegraph, Huffington ...
In the Cambridge Structural Database of small-molecule structures, more than 95% of the 500,000+ crystals have an R-factor lower than 0.15, and 9.5% have an R-factor lower than 0.03. Crystallographers also use the Free R-Factor ( R F r e e {\displaystyle R_{Free}} ) [ 3 ] to assess possible overmodeling of the data.
X-ray filters are also used for X-ray diffraction, in determinations of the interatomic spaces of crystalline solids. These lattice spacings can be determined using Bragg diffraction, but this technique requires scans to be done with approximately monochromatic X-ray beams. Thus, filter set ups like the copper nickel system described above are ...
Rietveld refinement is a technique described by Hugo Rietveld for use in the characterisation of crystalline materials. The neutron and X-ray diffraction of powder samples results in a pattern characterised by reflections (peaks in intensity) at certain positions.