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  2. Scanning helium ion microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_Helium_Ion_Microscope

    A scanning helium ion microscope (SHIM, HeIM or HIM) is an imaging technology based on a scanning helium ion beam. [2] Similar to other focused ion beam techniques, it allows to combine milling and cutting of samples with their observation at sub-nanometer resolution.

  3. Scanning helium microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_helium_microscopy

    The scanning helium microscope (SHeM) is a form of microscopy that uses low-energy (5–100 meV) neutral helium atoms to image the surface of a sample without any damage to the sample caused by the imaging process. Since helium is inert and neutral, it can be used to study delicate and insulating surfaces.

  4. Focused ion beam - Wikipedia

    en.wikipedia.org/wiki/Focused_ion_beam

    Another ion source seen in commercially available instruments is a helium ion source, which is inherently less damaging to the sample than Ga ions although it will still sputter small amounts of material especially at high magnifications and long scan times. As helium ions can be focused into a small probe size and provide a much smaller sample ...

  5. Scanning helium microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_helium_microscope

    Scanning helium microscope may refer to: Scanning helium microscopy; Scanning Helium Ion Microscope; Atomic nanoscope, which was proposed and discussed in the literature, but is not yet competitive with optical microscope, electron microscope, Scanning Helium Ion Microscope and various scanning probe microscopes

  6. Ion beam lithography - Wikipedia

    en.wikipedia.org/wiki/Ion_beam_lithography

    Ion-beam lithography offers higher resolution patterning than UV, X-ray, or electron beam lithography because these heavier particles have more momentum. This gives the ion beam a smaller wavelength than even an e-beam and therefore almost no diffraction. The momentum also reduces scattering in the target and in any residual gas.

  7. JEOL - Wikipedia

    en.wikipedia.org/wiki/JEOL

    They produced their first mass spectrometer in 1963, and their first scanning electron microscope in 1966. In 1968, they produced the first amino acid analyzer in the world, the JLC-5AH. [ 12 ] The company also continued to develop its line of electron microscopes.

  8. Nanoscale secondary ion mass spectrometry - Wikipedia

    en.wikipedia.org/wiki/Nanoscale_secondary_ion...

    NanoSIMS (nanoscale secondary ion mass spectrometry) is an analytical instrument manufactured by CAMECA which operates on the principle of secondary ion mass spectrometry. [1] The NanoSIMS is used to acquire nanoscale resolution measurements [ 2 ] of the elemental and isotopic composition of a sample.

  9. Scanning ion-conductance microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_ion-conductance...

    Scanning ion-conductance microscopy diagram. Scanning ion-conductance microscopy (SICM) is a scanning probe microscopy technique that uses an electrode as the probe tip. [1] SICM allows for the determination of the surface topography of micrometer and even nanometer-range [2] structures in aqueous media conducting electrolytes. The samples can ...

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