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X-ray diffraction computed tomography is an experimental technique that combines X-ray diffraction with the computed tomography data acquisition approach. X-ray diffraction (XRD) computed tomography (CT) was first introduced in 1987 by Harding et al. [ 1 ] using a laboratory diffractometer and a monochromatic X-ray pencil beam .
A Philips PW1606 X-ray fluorescence spectrometer with automated sample feed in a cement plant quality control laboratory XRF scanning of the Rembrandt-painting Syndics of the Drapers' Guild. A Helmut Fischer(company) X-ray fluorescence spectrometer which are used to check for metals coating thickness and any of potential contamination of ...
When introduced in 1973, the original Miniflex was about one-tenth the size, and dramatically less expensive, than conventional X-ray diffraction equipment of the period. The original instrument, and its successor that was introduced in 1976, employed a horizontal goniometer with data output provided by an internal strip chart recorder .
XRD may refer to: X-ray diffraction , used to study the structure, composition, and physical properties of materials Extensible Resource Descriptor , an XML format for discovery of metadata about a web resource
The detector end of a simple x-ray diffractometer with an area detector. The direction of the X-rays is indicated with the red arrow. A typical diffractometer consists of a source of radiation, a monochromator to choose the wavelength, slits to adjust the shape of the beam, a sample and a detector.
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering , when there is no change in the energy of the waves.
The Philicorda came out of the Philips Natuurkundig Laboratorium in Eindhoven, under Tom Dissevelt and Dick Raaijmakers, who worked on electronic music and electronic musical instruments; it was here that the prototype of the AG7400 organ was produced.
Anomalous X-ray scattering (AXRS or XRAS) is a non-destructive determination technique within X-ray diffraction that makes use of the anomalous dispersion that occurs when a wavelength is selected that is in the vicinity of an absorption edge of one of the constituent elements of the sample. It is used in materials research to study nanometer ...