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A scanning helium ion microscope (SHIM, HeIM or HIM) is an imaging technology based on a scanning helium ion beam. [2] Similar to other focused ion beam techniques, it allows to combine milling and cutting of samples with their observation at sub-nanometer resolution.
As helium ions can be focused into a small probe size and provide a much smaller sample interaction than high energy (>1 kV) electrons in the SEM, the He ion microscope can generate equal or higher resolution images with good material contrast and a higher depth of focus. Commercial instruments are capable of sub 1 nm resolution. [21] [22]
The scanning helium microscope (SHeM) is a form of microscopy that uses low-energy (5–100 meV) neutral helium atoms to image the surface of a sample without any damage to the sample caused by the imaging process. Since helium is inert and neutral, it can be used to study delicate and insulating surfaces.
Scanning helium microscope may refer to: Scanning helium microscopy; Scanning Helium Ion Microscope; Atomic nanoscope, which was proposed and discussed in the literature, but is not yet competitive with optical microscope, electron microscope, Scanning Helium Ion Microscope and various scanning probe microscopes
FEI Company (Field Electron and Ion Company) was an American company that designed, manufactured, and supported microscope technology. Headquartered in Hillsboro, Oregon , FEI had over 2,800 employees and sales and service operations in more than 50 countries around the world.
JEOL Ltd. has four business segments. Electron Optics manufactures scanning electron microscopes, transmission electron microscopes and scanning probe microscopes, along with related equipment. The Analytical Instruments section's products include mass spectrometers, nuclear magnetic resonance and electron spin resonance equipment. The ...
Scanning ion-conductance microscopy diagram. Scanning ion-conductance microscopy (SICM) is a scanning probe microscopy technique that uses an electrode as the probe tip. [1] SICM allows for the determination of the surface topography of micrometer and even nanometer-range [2] structures in aqueous media conducting electrolytes. The samples can ...
Tungsten sample being irradiated with 60 keV He ions at 500°C using the MIAMI-1 system. The MIAMI facility (acronym for Microscopes and Ion Accelerators for Materials Investigation) is a scientific laboratory located within the Ion Beam Centre [1] at the University of Huddersfield.