enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. Capacitor plague - Wikipedia

    en.wikipedia.org/wiki/Capacitor_plague

    Failed aluminium electrolytic capacitors with open vents in the top of the can, and visible dried electrolyte residue (reddish-brown color) The capacitor plague was a problem related to a higher-than-expected failure rate of non-solid aluminium electrolytic capacitors between 1999 and 2007, especially those from some Taiwanese manufacturers, [1] [2] due to faulty electrolyte composition that ...

  3. Failure of electronic components - Wikipedia

    en.wikipedia.org/wiki/Failure_of_electronic...

    Structurally, capacitors consist of electrodes separated by a dielectric, connecting leads, and housing; deterioration of any of these may cause parameter shifts or failure. Shorted failures and leakage due to increase of parallel parasitic resistance are the most common failure modes of capacitors, followed by open failures.

  4. Leakage (electronics) - Wikipedia

    en.wikipedia.org/wiki/Leakage_(electronics)

    Leakage increases power consumption and if sufficiently large can cause complete circuit failure. Leakage is currently one of the main factors limiting increased computer processor performance. Efforts to minimize leakage include the use of strained silicon , high-κ dielectrics , and/or stronger dopant levels in the semiconductor.

  5. Electrical breakdown - Wikipedia

    en.wikipedia.org/wiki/Electrical_breakdown

    Electrical breakdown in an electric discharge showing the ribbon-like plasma filaments from a Tesla coil.. In electronics, electrical breakdown or dielectric breakdown is a process that occurs when an electrically insulating material (a dielectric), subjected to a high enough voltage, suddenly becomes a conductor and current flows through it.

  6. Time-dependent gate oxide breakdown - Wikipedia

    en.wikipedia.org/wiki/Time-dependent_gate_oxide...

    Time-dependent gate oxide breakdown (or time-dependent dielectric breakdown, TDDB) is a kind of transistor aging, a failure mechanism in MOSFETs, when the gate oxide breaks down as a result of long-time application of relatively low electric field (as opposed to immediate breakdown, which is caused by strong electric field).

  7. Electrolytic capacitor - Wikipedia

    en.wikipedia.org/wiki/Electrolytic_capacitor

    Applying a reverse polarity voltage, or a voltage exceeding the maximum rated working voltage of as little as 1 or 1.5 volts, can damage the dielectric causing catastrophic failure of the capacitor itself. Failure of electrolytic capacitors can result in an explosion or fire, potentially causing damage to other components as well as injuries.

  8. Dielectric absorption - Wikipedia

    en.wikipedia.org/wiki/Dielectric_absorption

    Dielectric absorption is the name given to the effect by which a capacitor, that has been charged for a long time, discharges only incompletely when briefly discharged.. Although an ideal capacitor would remain at zero volts after being discharged, real capacitors will develop a small voltage from time-delayed dipole discharging, [1] a phenomenon that is also called dielectric relaxation ...

  9. Ground bounce - Wikipedia

    en.wikipedia.org/wiki/Ground_bounce

    This happens because the ground bounce puts the input of a flip flop effectively at voltage level that is neither a one nor a zero at clock time, or causes untoward effects in the clock itself. A similar voltage sag phenomenon may be seen on the collector side, called supply voltage sag (or V CC sag ), where V CC is pulled unnaturally low.