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Boundary scan is a method for testing interconnects (wire lines) on printed circuit boards or sub-blocks inside an integrated circuit (IC).Boundary scan is also widely used as a debugging method to watch integrated circuit pin states, measure voltage, or analyze sub-blocks inside an integrated circuit.
ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.
EXTEST, INTEST, standard instructions, but operating on the core instead of an external boundary scan chain. EXTEST is nominally for writing data to the core, INTEST is nominally for reading it; but two scan chains are exceptions to that rule.
TRADE NEWS: Agilent Technologies Boundary Scan Analyzer Now Supports Intel® Silicon View Technology SANTA CLARA, Calif.--(BUSINESS WIRE)-- Agilent Technologies Inc. (NYS: A) today announced Intel ...
TRADE NEWS: Agilent Technologies Launches Versatile Benchtop Boundary Scan Analyzer for Electronic Test New Analyzer Provides Test Coverage from Prototyping to High-Volume Manufacturing SANTA ...
A later standard in the boundary-scan family, the IEEE 1149.6 Boundary-Scan Standard for Advanced Digital Networks, [4] utilizes the 1149.1 boundary-scan embedded instrumentation infrastructure but expands the types of chip-to-chip interconnects that can be tested. Whereas the 1149.1 standard defines a methodology for testing DC-coupled ...
In scan-design, registers (flip-flops or latches) in the design are connected in one or more scan chains, which are used to gain access to internal nodes of the chip. Test patterns are shifted in via the scan chain(s), functional clock signals are pulsed to test the circuit during the "capture cycle(s)", and the results are then shifted out to ...
Boundary scan description language (BSDL) is a hardware description language for electronics testing using JTAG.It has been added to the IEEE Std. 1149.1, and BSDL files are increasingly well supported by JTAG tools for boundary scan applications, and by test case generators.