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In wide-field multiphoton microscopy the high intensities are best achieved using an optically amplified pulsed laser source to attain a large field of view (~100 μm). [ 2 ] [ 3 ] [ 4 ] The image in this case is obtained as a single frame with a CCD without the need of scanning, making the technique particularly useful to visualize dynamic ...
Antonie van Leeuwenhoek (1632–1723). The field of microscopy (optical microscopy) dates back to at least the 17th-century.Earlier microscopes, single lens magnifying glasses with limited magnification, date at least as far back as the wide spread use of lenses in eyeglasses in the 13th century [2] but more advanced compound microscopes first appeared in Europe around 1620 [3] [4] The ...
Photo-activated localization microscopy (PALM or FPALM) [1] [2] and stochastic optical reconstruction microscopy (STORM) [3] are widefield (as opposed to point scanning techniques such as laser scanning confocal microscopy) fluorescence microscopy imaging methods that allow obtaining images with a resolution beyond the diffraction limit.
PEEM – Photoemission electron microscopy (or photoelectron emission microscopy) PES – Photoelectron spectroscopy; PINEM – photon-induced near-field electron microscopy; PIGE – Particle (or proton) induced gamma-ray spectroscopy, see nuclear reaction analysis; PIXE – Particle (or proton) induced X-ray spectroscopy; PL – Photoluminescence
The characterization technique optical microscopy showing the micron scale dendritic microstructure of a bronze alloy. Characterization, when used in materials science, refers to the broad and general process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science ...
With no modification to the microscope, i.e. with a simple wide field light microscope, the quality of optical sectioning is governed by the same physics as the depth of field effect in photography. For a high numerical aperture lens, equivalent to a wide aperture, the depth of field is small (shallow focus) and gives good optical sectioning.
Interferometric scattering microscopy (iSCAT) refers to a class of methods that detect and image a subwavelength object by interfering the light scattered by it with a reference light field. The underlying physics is shared by other conventional interferometric methods such as phase contrast or differential interference contrast , or reflection ...
Light MicrOscopical Nanosizing microscopy (3D LIMON) images, using the Vertico SMI microscope, are made possible by the combination of SMI and SPDM, whereby first the SMI, and then the SPDM, process is applied. The SMI process determines the center of particles and their spread in the direction of the microscope axis. While the center of ...