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The sense pin is used to relay the rotation speed of the fan and the control pin is an open-drain or open-collector output, which requires a pull-up to 5 V or 3.3 V in the fan. Unlike linear voltage regulation, where the fan voltage is proportional to the speed, the fan is driven with a constant supply voltage; the speed control is performed by ...
One challenge for the industry is keeping up with the rapid advances in chip technology (I/O count/size/placement/spacing, I/O speed, internal circuit count/speed/power, thermal control, etc.) without being forced to continually upgrade the test equipment. Modern DFT techniques, hence, have to offer options that allow next generation chips and ...
A short in the coil creates a closed circuit that will act like the secondary coil of a transformer, with the growler acting like the primary coil. This will induce an alternating current in the shorted armature that will in turn cause an alternating magnetic field to encircle the shorted armature coil. A flat, broad, flexible piece of metal ...
An electronic speed control (ESC) is an electronic circuit that controls and regulates the speed of an electric motor. It may also provide reversing of the motor and dynamic braking. Miniature electronic speed controls are used in electrically powered radio controlled models. Full-size electric vehicles also have systems to control the speed of ...
A common form of in-circuit testing uses a bed-of-nails tester.This is a fixture that uses an array of spring-loaded pins known as "pogo pins". When a printed circuit board is aligned with and pressed down onto the bed-of-nails tester, the pins make electrical contact with locations on the circuit board, allowing them to be used as test points for in-circuit testing.
The test often reveals problems that occurred during assembly, such as defective components, improper component placement, and insulator defects that may cause inadvertent shorting or grounding to chassis, in turn, compromising electrical circuit quality and product safety.
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ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.