enow.com Web Search

Search results

  1. Results from the WOW.Com Content Network
  2. Structural equation modeling - Wikipedia

    en.wikipedia.org/wiki/Structural_equation_modeling

    Structural equation modeling (SEM) is a diverse set of methods used by scientists for both observational and experimental research. SEM is used mostly in the social and behavioral science fields, but it is also used in epidemiology, [2] business, [3] and other fields. A common definition of SEM is, "...a class of methodologies that seeks to ...

  3. Spectral element method - Wikipedia

    en.wikipedia.org/wiki/Spectral_element_method

    In the numerical solution of partial differential equations, a topic in mathematics, the spectral element method (SEM) is a formulation of the finite element method (FEM) that uses high-degree piecewise polynomials as basis functions. The spectral element method was introduced in a 1984 paper [1] by A. T. Patera. Although Patera is credited ...

  4. Scanning electron microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_electron_microscope

    An account of the early history of scanning electron microscopy has been presented by McMullan. [2] [3] Although Max Knoll produced a photo with a 50 mm object-field-width showing channeling contrast by the use of an electron beam scanner, [4] it was Manfred von Ardenne who in 1937 invented [5] a microscope with high resolution by scanning a very small raster with a demagnified and finely ...

  5. Electron backscatter diffraction - Wikipedia

    en.wikipedia.org/wiki/Electron_backscatter...

    Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In the microscope an ...

  6. Electron channelling contrast imaging - Wikipedia

    en.wikipedia.org/wiki/Electron_channelling...

    Electron channelling contrast imaging (ECCI) is a scanning electron microscope (SEM) diffraction technique used in the study of defects in materials. These can be dislocations or stacking faults that are close to the surface of the sample, low angle grain boundaries or atomic steps.

  7. Scanning helium ion microscope - Wikipedia

    en.wikipedia.org/wiki/Scanning_Helium_Ion_Microscope

    In terms of imaging, SHIM has several advantages over the traditional scanning electron microscope (SEM). Owing to the very high source brightness, and the short De Broglie wavelength of the helium ions, which is inversely proportional to their momentum, it is possible to obtain qualitative data not achievable with conventional microscopes ...

  8. File:Scanning Electron Microscope.ogv - Wikipedia

    en.wikipedia.org/wiki/File:Scanning_Electron...

    You are free: to share – to copy, distribute and transmit the work; to remix – to adapt the work; Under the following conditions: attribution – You must give appropriate credit, provide a link to the license, and indicate if changes were made. You may do so in any reasonable manner, but not in any way that suggests the licensor endorses ...

  9. Society for Experimental Mechanics - Wikipedia

    en.wikipedia.org/wiki/Society_for_Experimental...

    Society for Experimental Mechanics (SEM) is a professional organization for engineers and scientists studying the design and implementation of experiments to characterize materials, structures, and systems.