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The simplest definition of a switch is “a device that opens or closes a circuit.” [1] A relay is an electronically operated switch. Three relay types are commonly used in automated test system switching: Electromechanical relays are the most-often-used type because they have the largest signal range capability of the three.
The addition of a high-speed switching system to a test system's configuration allows for faster, more cost-effective testing of multiple devices, and is designed to reduce both test errors and costs. Designing a test system's switching configuration requires an understanding of the signals to be switched and the tests to be performed, as well ...
ITU-T Y.1564 is designed to serve as a network service level agreement (SLA) validation tool, ensuring that a service meets its guaranteed performance settings in a controlled test time, to ensure that all services carried by the network meet their SLA objectives at their maximum committed rate, and to perform medium- and long-term service testing, confirming that network elements can properly ...
Scheduler switches contexts at equal intervals of time. This interval depends on the speed of individual processors, memory-cache hierarchy state and system load. Even on the same processor, under the same load, the interval varies slightly due to minor variations in frequency of the system clock. 2. Page Faults
An RF switch or microwave switch is a device to route high frequency signals through transmission paths. RF ( radio frequency ) and microwave switches are used extensively in microwave test systems for signal routing between instruments and devices under test (DUT).
A more likely scenario is network congestion within a switch. For example, a flow can come into a switch on a higher speed link than the one it goes out, or several flows can come in over two or more links that total more than an output link's bandwidth. These will eventually exhaust any amount of buffering in the switch.
The most common method for delivering test data from chip inputs to internal circuits under test (CUTs, for short), and observing their outputs, is called scan-design. In scan-design, registers ( flip-flops or latches) in the design are connected in one or more scan chains , which are used to gain access to internal nodes of the chip.
Load testing is the simplest form of performance testing. A load test is usually conducted to understand the behavior of the system under a specific expected load. This load can be the expected concurrent number of users on the application performing a specific number of transactions within the set duration.