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X-rays (X-radiation) are a form of high-energy electromagnetic radiation. In many languages, it is referred to as Röntgen radiation, after the German scientist Wilhelm Conrad Röntgen, who discovered it in 1895 [1] and named it X-radiation to signify an unknown type of radiation.
X-ray diffraction is a generic term for phenomena associated with changes in the direction of X-ray beams due to interactions with the electrons around atoms. It occurs due to elastic scattering, when there is no change in the energy of the waves. The resulting map of the directions of the X-rays far from the sample is called a diffraction pattern.
X-ray fluorescence. XRF scanning of the Rembrandt -painting Syndics of the Drapers' Guild. A handheld XRF analyzer gun. X-ray fluorescence (XRF) is the emission of characteristic "secondary" (or fluorescent) X-rays from a material that has been excited by being bombarded with high-energy X-rays or gamma rays.
An X-ray spectrograph consists of a high voltage power supply (50 kV or 100 kV), a broad band X-ray tube, usually with a tungsten anode and a beryllium window, a specimen holder, an analyzing crystal, a goniometer, and an X-ray detector device. These are arranged as shown in Fig. 1.
An X-ray image intensifier (XRII) is an image intensifier that converts X-rays into visible light at higher intensity than the more traditional fluorescent screens can. Such intensifiers are used in X-ray imaging systems (such as fluoroscopes) to allow low-intensity X-rays to be converted to a conveniently bright visible light output.
Radiant intensity is used to characterize the emission of radiation by an antenna: [2], = (), where E e is the irradiance of the antenna;; r is the distance from the antenna.; Unlike power density, radiant intensity does not depend on distance: because radiant intensity is defined as the power through a solid angle, the decreasing power density over distance due to the inverse-square law is ...
X-ray optics. X-ray optics is the branch of optics that manipulates X-rays instead of visible light. It deals with focusing and other ways of manipulating the X-ray beams for research techniques such as X-ray diffraction, X-ray crystallography, X-ray fluorescence, small-angle X-ray scattering, X-ray microscopy, X-ray phase-contrast imaging, and ...
X-ray reflectivity. X-ray reflectivity (sometimes known as X-ray specular reflectivity, X-ray reflectometry, or XRR) is a surface-sensitive analytical technique used in chemistry, physics, and materials science to characterize surfaces, thin films and multilayers. [1][2][3][4][5] It is a form of reflectometry based on the use of X-rays and is ...