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  2. Bright-field microscopy - Wikipedia

    en.wikipedia.org/wiki/Bright-field_microscopy

    A bright-field microscope has many important parts including; the condenser, the objective lens, the ocular lens, the diaphragm, and the aperture. Some other pieces of the microscope that are commonly known are the arm, the head, the illuminator, the base, the stage, the adjusters, and the brightness adjuster.

  3. Microscopy - Wikipedia

    en.wikipedia.org/wiki/Microscopy

    Antonie van Leeuwenhoek (1632–1723). The field of microscopy (optical microscopy) dates back to at least the 17th-century.Earlier microscopes, single lens magnifying glasses with limited magnification, date at least as far back as the wide spread use of lenses in eyeglasses in the 13th century [2] but more advanced compound microscopes first appeared in Europe around 1620 [3] [4] The ...

  4. Non-contact atomic force microscopy - Wikipedia

    en.wikipedia.org/wiki/Non-contact_atomic_force...

    The microscope can then use the change in resonant frequency (f) as the SPM reference channel, either in feedback mode, or it can be recorded directly in constant height mode. While recording frequency-modulated images, an additional feedback loop is normally used to keep the amplitude of resonance constant, by adjusting the drive amplitude.

  5. Optical microscope - Wikipedia

    en.wikipedia.org/wiki/Optical_microscope

    Diagram of a simple microscope. There are two basic types of optical microscopes: simple microscopes and compound microscopes. A simple microscope uses the optical power of a single lens or group of lenses for magnification. A compound microscope uses a system of lenses (one set enlarging the image produced by another) to achieve a much higher ...

  6. Kelvin probe force microscope - Wikipedia

    en.wikipedia.org/wiki/Kelvin_probe_force_microscope

    Block diagram of a scanning Kelvin probe (SKP) instrument showing computer, control unit, scan axes, vibrator, probe, and sample. The cantilever in the AFM is a reference electrode that forms a capacitor with the surface, over which it is scanned laterally at a constant separation.

  7. Wafer bond characterization - Wikipedia

    en.wikipedia.org/wiki/Wafer_bond_characterization

    The micro chevron (MC) test is a modification of the chevron test using a specimen of defined and reproducible size and shape. The test allows the determination of the critical energy release rate G I C {\displaystyle G_{IC}} and the critical fracture toughness K I C {\displaystyle K_{IC}} . [ 13 ]

  8. Scanning transmission electron microscopy - Wikipedia

    en.wikipedia.org/wiki/Scanning_transmission...

    A scanning transmission electron microscope (STEM) is a type of transmission electron microscope (TEM). Pronunciation is [stɛm] or [ɛsti:i:ɛm]. As with a conventional transmission electron microscope (CTEM), images are formed by electrons passing through a sufficiently thin specimen. However, unlike CTEM, in STEM the electron beam is focused ...

  9. Fluorescence microscope - Wikipedia

    en.wikipedia.org/wiki/Fluorescence_microscope

    [1] [2] "Fluorescence microscope" refers to any microscope that uses fluorescence to generate an image, whether it is a simple set up like an epifluorescence microscope or a more complicated design such as a confocal microscope, which uses optical sectioning to get better resolution of the fluorescence image. [3]

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