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  2. Automatic test switching - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_switching

    Automatic test system switching test equipment allows for high-speed testing of a device or devices in a test situation, where strict sequences and combinations of switching must be observed. By automating the process in this way, the possibility of test errors and inaccuracies is minimized, and only systematic errors would generally be ...

  3. Automatic test pattern generation - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_pattern...

    ATPG (acronym for both automatic test pattern generation and automatic test pattern generator) is an electronic design automation method or technology used to find an input (or test) sequence that, when applied to a digital circuit, enables automatic test equipment to distinguish between the correct circuit behavior and the faulty circuit behavior caused by defects.

  4. Automatic test equipment - Wikipedia

    en.wikipedia.org/wiki/Automatic_test_equipment

    Automatic test equipment diagnostics is the part of an ATE test that determines the faulty components. ATE tests perform two basic functions. The first is to test whether or not the Device Under Test is working correctly. The second is when the DUT is not working correctly, to diagnose the reason.

  5. Design for testing - Wikipedia

    en.wikipedia.org/wiki/Design_for_testing

    The tests are generally driven by test programs that execute using automatic test equipment (ATE) or, in the case of system maintenance, inside the assembled system itself. In addition to finding and indicating the presence of defects (i.e., the test fails), tests may be able to log diagnostic information about the nature of the encountered ...

  6. Abbreviated Test Language for All Systems - Wikipedia

    en.wikipedia.org/wiki/Abbreviated_Test_Language...

    Abbreviated Test Language for All Systems (ATLAS) is a specialized programming language for use with automatic test equipment (ATE). It is a compiled high-level computer language and can be used on any computer whose supporting software can translate it into the appropriate low-level instructions .

  7. Stuck-at fault - Wikipedia

    en.wikipedia.org/wiki/Stuck-at_fault

    A stuck-at fault is a particular fault model used by fault simulators and automatic test pattern generation (ATPG) tools to mimic a manufacturing defect within an integrated circuit. Individual signals and pins are assumed to be stuck at Logical '1', '0' and 'X'. For example, an input is tied to a logical 1 state during test generation to ...

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  9. Test automation - Wikipedia

    en.wikipedia.org/wiki/Test_automation

    Test automation can be made cost-effective in the long term, especially when used repeatedly in regression testing. A good candidate for test automation is a test case for common flow of an application, as it is required to be executed (regression testing) every time an enhancement is made in the application.